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Numerous progress has been made in the field of applied photogrammetry in the last decade, including the usage of close-range photogrammetry as a mean of conservation and record of outcrops. In the present contribution, we use the SfM-MVS method combined with a wavelet decomposition analysis of the surface, in order to relate it to morphological and surface roughness data. The results demonstrated that wavelet decomposition and RMS could provide a rapid insight on the location of coarser materials and individual outliers, while arithmetic surface roughness were more useful to detect units or layers that are similar on the outcrop. The method also emphasizes the fact that the automation of the process does not allows clear distinction between any artefact crack or surface change and that human supervision is still essential despite the original goal of automating the outcrop surface analysis.