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Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer
oleh: Tinglu Song, Meishuai Zou, Defeng Lu, Hanyuan Chen, Benpeng Wang, Shuo Wang, Fan Xu
Format: | Article |
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Diterbitkan: | MDPI AG 2021-11-01 |
Deskripsi
In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS. We found by surprise that these two results seem to be inconsistent with each other. Therefore, other surface characteristic tools such as SEM-EDS were further used to provide additional supports. The results indicated that such differences may originate from the variance of secondary ion yields, which might be affected by crystal orientation.