On the Properties of Yttria-Stabilized Zirconia Thin Films Prepared by Sol-Gel Method
oleh: Artūras ŽALGA, Brigita ABAKEVIČIENĖ, Aleksej ŽARKOV, Aldona BEGANSKIENĖ, Aivaras KAREIVA, Sigitas TAMULEVIČIUS
| Format: | Article |
|---|---|
| Diterbitkan: | Kaunas University of Technology 2011-07-01 |
Deskripsi
The synthesis of nanostructured films of 20 mol% Y<sub>2</sub>O<sub>3</sub> stabilized ZrO<sub>2</sub> on corundum (Al<sub>2</sub>O<sub>3</sub>) substrates was performed from different sols using dip-coating technique. All obtained samples were repeatedly annealed at 800<sub> </sub>°C temperature after each dipping procedure and fully characterized by X-ray diffraction (XRD) analysis. XRD data exhibited that at 800<sub> </sub>°C temperature nano-sized Y<sub>0.2</sub>Zr<sub>0.8</sub>O<sub>2</sub> thin films with cubic (Fm-3m) crystal structure have been formed. The morphological features of obtained coatings were investigated by scanning electron microscopy (SEM) and atomic force microscopy (AFM). The surface tension and hydrophility of the synthesized films were determined by contact angle measurements (CAM).<p><a href="http://dx.doi.org/10.5755/j01.ms.17.2.491">http://dx.doi.org/10.5755/j01.ms.17.2.491</a></p>