Direct electric field imaging of graphene defects
oleh: Ryo Ishikawa, Scott D. Findlay, Takehito Seki, Gabriel Sánchez-Santolino, Yuji Kohno, Yuichi Ikuhara, Naoya Shibata
| Format: | Article |
|---|---|
| Diterbitkan: | Nature Portfolio 2018-09-01 |
Deskripsi
Imaging chemical bonding states in defective graphene is important to determine its functional properties. Here, the authors report triangular and rectangular atomic electric fields in monolayer graphene induced by silicon as imaged by differential phase contrast STEM.