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Pixel-Wise Defect Detection by CNNs without Manually Labeled Training Data
oleh: M. Haselmann, D. P. Gruber
Format: | Article |
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Diterbitkan: | Taylor & Francis Group 2019-05-01 |
Deskripsi
In machine learning driven surface inspection one often faces the issue that defects to be detected are difficult to make available for training, especially when pixel-wise labeling is required. Therefore, supervised approaches are not feasible in many cases. In this paper, this issue is circumvented by injecting synthetized defects into fault-free surface images. In this way, a fully convolutional neural network was trained for pixel-accurate defect detection on decorated plastic parts, reaching a pixel-wise PRC score of 78% compared to 8% that was reached by a state-of-the-art unsupervised anomaly detection method. In addition, it is demonstrated that a similarly good performance can be reached even when the network is trained on only five fault-free parts.