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Statistical analysis of hard X-ray radiation at the PAL-XFEL facility performed by Hanbury Brown and Twiss interferometry
oleh: Young Yong Kim, Ruslan Khubbutdinov, Jerome Carnis, Sangsoo Kim, Daewoong Nam, Inhyuk Nam, Gyujin Kim, Chi Hyun Shim, Haeryong Yang, Myunghoon Cho, Chang-Ki Min, Changbum Kim, Heung-Sik Kang, Ivan A. Vartanyants
| Format: | Article |
|---|---|
| Diterbitkan: | International Union of Crystallography 2022-11-01 |
Deskripsi
A Hanbury Brown and Twiss interferometry experiment based on second-order correlations was performed at the PAL-XFEL facility. The statistical properties of the X-ray radiation were studied within this experiment. Measurements were performed at the NCI beamline at 10 keV photon energy under various operation conditions: self-amplified spontaneous emission (SASE), SASE with a monochromator, and self-seeding regimes at 120 pC, 180 pC and 200 pC electron bunch charge. Statistical analysis showed short average pulse duration from 6 fs to 9 fs depending on the operational conditions. A high spatial degree of coherence of about 70–80% was determined in the spatial domain for the SASE beams with the monochromator and self-seeding regime of operation. The obtained values describe the statistical properties of the beams generated at the PAL-XFEL facility.