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The grain aphid, <i>Sitobion miscanthi</i> causes serious damage by removing nutritional content from wheat plants and transmitting viral diseases. The use of resistant wheat cultivars is an effective method of aphid management. To identify <i>S. miscanthi</i> resistant cultivars, preliminary antixenosis resistance screening was conducted on 112 Ethiopian and 21 Chinese wheat accessions and varieties along with bioassay to test for further antixenosis resistance, identification of aphid feeding behavior using electrical penetration graph (EPG), and imaging of leaf trichome densities using a 3D microscope. According to antixenosis resistance screening, one highly-resistant, 25 moderately-resistant, and 38 slightly-resistant wheat cultivars to <i>S. miscanthi</i> were identified. Aphid choice tests showed that Luxuan266, 243726, and 213312 were the least preferred after 12, 24, 48, and 72 h of <i>S. miscanthi</i> release. Longer duration of Np, longer time to first probe, and shorter duration of E2 waveforms were recorded in Lunxuan266, 243726, and 213312 than in Beijing 837. The trichome density on adaxial and abaxial leaf surfaces of Lunxuan266, 243726 and 213312 was significantly higher than on those of Beijing 837. We concluded that Lunxuan266, 243726, and 213312 were antixenosis resistant to <i>S. miscanthi</i> based on the choice test, EPG results, and leaf trichome densities.