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Here we present an interferometric wide field hyperspectral microscope based on a common-path birefringent interferometer with translating wedges, to measure photoluminescence emission from two-dimensional semiconductors. We show diffraction-limited hyperspectral photoluminescence microscopy from two-dimensional materials across millimeter areas, proving that our hyperspectral microscope is a compact, stable and fast tool to characterize the optical properties and the morphology of 2D materials across ultralarge areas.