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Abstract We investigate theoretically and experimentally the environment-induced voltage shot noise in current biased Josephson junctions induced by phase particle tunneling. Quantum mechanical treatment based on the Caldeira-Leggett model with tight-binding formulation in local Wannier bases gives a clear picture of the voltage shot noise. A universal form of the zero-frequency noise spectrum is obtained, which exhibits a quadratic dependence on the mean voltage in small bias region. The quadratic dependence is verified experimentally on junctions covering a wide range of parameters, and is found also in junction arrays of various array sizes.