Find in Library

A defect’s detectability in flash thermography is highly dependent on the applied post-processing methodology. The majority of the existing analysis techniques operate either on the time-temperature data or on the frequency-phase data. In this paper, we compare the efficiency of time- and frequency-domain analysis techniques in flash thermography for obtaining good defect detectability. Both single-bin and integrated-bin evaluation procedures are considered: dynamic thermal tomography and thermal signal area for the time-domain approach, and frequency domain tomography and adaptive spectral band integration for the frequency-domain approach. The techniques are applied on various carbon fiber reinforced polymer samples having a range of defect sizes and defect types. The advantages and drawbacks of the different post-processing techniques are evaluated and discussed. The best defect detectability is achieved using the integrated procedure in frequency domain.