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Deep learning-enhanced microscopy with extended depth-of-field
oleh: Yide Zhang
Format: | Article |
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Diterbitkan: | Nature Publishing Group 2023-11-01 |
Deskripsi
Abstract A computational imaging platform utilizing a physics-incorporated, deep-learned design of binary phase filter and a jointly optimized deconvolution neural network has been reported, achieving high-resolution, high-contrast imaging over extended depth ranges without the need for serial refocusing.