Dependence of the Sheet Resistivity and Current Noise Behaviour of the Grain Size and Volume Fraction of Conducting Material in Thick-Film Resistors Experiments
oleh: F. Müller, M. Wolf
| Format: | Article |
|---|---|
| Diterbitkan: | Wiley 1988-01-01 |
Deskripsi
Experimental results concerning the dependence of the sheet resistivity and the noise coefficient on the grain size and the volume fraction, respectively, of the metallic-like component in Bi2Ru2O7-based thick-film resistors are presented. The results are compared with current models for the electrical conduction mechanism in these resistors.