High-resolution, Non-destructive X-ray Tomography
oleh: Mirko Holler, Jörg Raab, Oliver Bunk, Ana Diaz, Elisabeth Müller, Roberto Dinapoli, Michal Odstrcil, Esther H. R. Tsai, Manuel Guizar-Sicairos, Gabriel Aeppli
| Format: | Article |
|---|---|
| Diterbitkan: | Swiss Chemical Society 2018-05-01 |
Deskripsi
Subjek
Integrated circuits; Nano tomography; Ptychography; X-ray imaging