Dispersion relation data for methylammonium lead triiodide perovskite deposited on a (100) silicon wafer using a two-step vapour-phase reaction process
oleh: Laurie J. Phillips, Atef M. Rashed, Robert E. Treharne, James Kay, Peter Yates, Ivona Z. Mitrovic, Ayendra Weerakkody, Steve Hall, Ken Durose
| Format: | Article |
|---|---|
| Diterbitkan: | Elsevier 2015-12-01 |
Deskripsi
Ellipsometry was used to measure the amplitude ratio and phase difference of light undergoing a phase shift as it interacts with a thin film of organic–inorganic hybrid perovskite CH3NH3PbI3 (MAPI) deposited onto a (100) silicon wafer. The refractive index and extinction coefficient was extracted from a multi-oscillator model fit to the ellipsometry data, as a function of wavelength, from 300 to 1500 nm.