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Robust In-Zn‑O Thin-Film Transistors with a Bilayer Heterostructure Design and a Low-Temperature Fabrication Process Using Vacuum and Solution Deposited Layers

oleh: Sang Yun Bang, Felix C. Mocanu, Tae Hoon Lee, Jiajie Yang, Shijie Zhan, Sung-Min Jung, Dong-Wook Shin, Yo-Han Suh, Xiang-Bing Fan, Sanghyo Lee, Hyung Woo Choi, Luigi G. Occhipinti, Soo Deok Han, Jong Min Kim