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The current image of single SnO<sub>2 </sub>nanobelt nanodevice studied by conductive atomic force microscopy
oleh: Wang Shujie, Cheng Gang, Cheng Ke, Jiang Xiaohong, Du Zuliang
Format: | Article |
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Diterbitkan: | SpringerOpen 2011-01-01 |
Deskripsi
<p>Abstract</p> <p>A single SnO<sub>2 </sub>nanobelt was assembled on a pair of Au electrodes by electric-field assembly method. The electronic transport property of single SnO<sub>2 </sub>nanobelt was studied by conductive atomic force microscopy (C-AFM). Back-to-back Schottky barrier-type junctions were created between AFM tip/SnO<sub>2 </sub>nanobelt/Au electrode which can be concluded from the I-V curve. The current images of single SnO<sub>2 </sub>nanobelt nanodevices were also studied by C-AFM techniques, which showed stripes patterns on the nanobelt surface. The current images of the nanobelt devices correlate the microscopy with separate transport properties measurement together.</p>