Efficient linear phase contrast in scanning transmission electron microscopy with matched illumination and detector interferometry
oleh: Colin Ophus, Jim Ciston, Jordan Pierce, Tyler R. Harvey, Jordan Chess, Benjamin J. McMorran, Cory Czarnik, Harald H. Rose, Peter Ercius
| Format: | Article |
|---|---|
| Diterbitkan: | Nature Portfolio 2016-02-01 |
Deskripsi
Scanning transmission electron microscopy is a powerful material probe, but constrained to large atomic number samples due to the issues of beam damage and weak scattering. Here, Ophus et al.propose a method that produces linear phase contrast in a focused electron beam to image dose-sensitive objects.