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SCAN-TO-BIM METHODOLOGY ADAPTED FOR DIFFERENT APPLICATION
oleh: V. Badenko, A. Fedotov, D. Zotov, S. Lytkin, D. Volgin, R. D. Garg, M. Liu
| Format: | Article |
|---|---|
| Diterbitkan: | Copernicus Publications 2019-09-01 |
Deskripsi
In this paper we proposed a methodology that describes the major steps of a scan-to-BIM process. The methodology includes six steps: (1) classification of considered elements, (2) definition of required level of detail (GI), (3) scan data acquisition, (4) point cloud registration and segmentation, (5) as-built BIM creation and (6) analysis. The examples of the application of the proposed methodology are demonstrated by creation of as-built BIM models for existing industrial sites and historic buildings. As the results of these case studies have shown, the proposed methodology can be used for as-built BIMs without any prior information.