Find in Library
Search millions of books, articles, and more
Indexed Open Access Databases
Boron Impurity Deposition on a Si(100) Surface in a SiHCl<sub>3</sub>-BCl<sub>3</sub>-H<sub>2</sub> System for Electronic-Grade Polysilicon Production
oleh: Qinghong Yang, Fengyang Chen, Lin Tian, Jianguo Wang, Ni Yang, Yanqing Hou, Lingyun Huang, Gang Xie
Format: | Article |
---|---|
Diterbitkan: | MDPI AG 2022-05-01 |
Deskripsi
A study of boron impurities deposited on a Si(100) surface in a SiHCl<sub>3</sub>-BCl<sub>3</sub>-H<sub>2</sub> system is reported in this paper, using periodic density functional theory with generalized gradient approximation (GGA). The results show that the discrete distances of BCl<sub>3</sub> and SiHCl<sub>3</sub> from the surface of the Si(100) unit cell are 1.873 Å and 2.340 Å, respectively, and the separation energies are −35.2549 kcal/mol and −10.64 kcal/mol, respectively. BCl<sub>3</sub> and SiHCl<sub>3</sub> are mainly adsorbed on the surface of the Si(100) unit cell in particular molecular orientations: the positive position and the hydrogen bottom-two-front position from the analysis of the bond length change and adsorption energy. The adsorption of SiHCl<sub>3</sub> and BCl<sub>3</sub> is accompanied by a charge transfer from the molecule to the surface of the unit cell of 0.24 and 0.29 eV, respectively. BCl<sub>3</sub> reacts more readily than SiHCl<sub>3</sub> with the Si(100) surface, resulting in the deposition of boron impurities on the polysilicon surface.