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GdMnO3 epitaxial thin films were deposited onto (110)-oriented SrTiO3 substrates by RF magnetron sputtering. The structure, microstructure, dielectric and magnetic properties were investigated in detail. The XRD results revealed that the GdMnO3 thin films exhibit an epitaxial strained orthorhombic symmetry and grow preferably in off-plane (001) orientation, wherein the basal lattice parameters are strained by the substrate lattice. A dielectric relaxation process was ascertained, whose activation energy is sensitive to the magnetic phase transitions, occurring at 41 K and at 20 K, respectively. The canted nature of the low temperature magnetic phase is discussed.