In situ microbeam surface X-ray scattering reveals alternating step kinetics during crystal growth
oleh: Guangxu Ju, Dongwei Xu, Carol Thompson, Matthew J. Highland, Jeffrey A. Eastman, Weronika Walkosz, Peter Zapol, G. Brian Stephenson
| Format: | Article |
|---|---|
| Diterbitkan: | Nature Portfolio 2021-03-01 |
Deskripsi
The basal-plane surfaces of hexagonal close-packed crystals typically exhibit an alternating sequence of A and B steps with different atomic structures and growth kinetics. Here the authors demonstrate a method to determine whether A or B steps have faster kinetics under specific growth conditions.