Absolute characterization of high numerical aperture microscope objectives utilizing a dipole scatterer
oleh: Jörg S. Eismann, Martin Neugebauer, Klaus Mantel, Peter Banzer
| Format: | Article |
|---|---|
| Diterbitkan: | Nature Publishing Group 2021-11-01 |
Deskripsi
An absolute characterization technique for microscope objectives is presented, working without a calibrated reference element. To achieve this, a reference wave is created by a sub-wavelength object.