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Detection of Simulated Defect Using IR Temperature Sensors and One Point Heating
oleh: Young Han Kim, Yong Kweon Suh, Young Gun Heo, Byoung Chul Kim
Format: | Article |
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Diterbitkan: | MDPI AG 2008-05-01 |
Deskripsi
Infrared temperature sensors, simple device for temperature measurement, have been modified for the measurement of temperature distribution on the metal surface in a way of nondestructive detection of defects of the object. In this study, the IR sensor system is utilized for the defect detection in a cylinder with one point heating, and the performance of the system is examined with an aluminum cylinder having a simulated defect. In addition, a 3-D conduction equation is numerically solved to compare the computed temperature profile with the measured one. The experimental outcome indicates that the defect detection is readily available with the proposed device and the point heating is practical for the applications of the defect detection. It is also found that the measured temperature distribution is comparable to the computed result from the conduction equation.