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X-ray beam monitoring and wavelength calibration using four-beam diffraction
oleh: XianRong Huang, Xianbo Shi, Lahsen Assoufid
Format: | Article |
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Diterbitkan: | International Union of Crystallography 2022-01-01 |
Deskripsi
Rigorous dynamical theory calculations show that four-beam diffraction (4BD) can be activated only by a unique photon energy and a unique incidence direction. Thus, 4BD may be used to precisely calibrate X-ray photon energies and beam positions. Based on the principles that the forbidden-reflection 4BD pattern, which is typically an X-shaped cross, can be generated by instant imaging using the divergent beam from a point source without rocking the crystal, a detailed real-time high-resolution beam (and source) position monitoring scheme is illustrated for monitoring two-dimensional beam positions and directions of modern synchrotron light sources, X-ray free-electron lasers and nano-focused X-ray sources.