Direct measurements of interfacial adhesion in 2D materials and van der Waals heterostructures in ambient air

oleh: Hossein Rokni, Wei Lu

Format: Article
Diterbitkan: Nature Portfolio 2020-11-01

Deskripsi

Here, the authors devise an experimental method based on atomic force microscopy to precisely measure the interfacial adhesion energy of layered materials, van der Waals heterostructures and two-dimensional materials on SiO2 substrates.