Surface Characterization of Polymer Blends by XPS and ToF-SIMS

oleh: Chi Ming Chan, Lu-Tao Weng

Format: Article
Diterbitkan: MDPI AG 2016-08-01

Deskripsi

The surface properties of polymer blends are important for many industrial applications. The physical and chemical properties at the surface of polymer blends can be drastically different from those in the bulk due to the surface segregation of the low surface energy component. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary mass spectrometry (ToF-SIMS) have been widely used to characterize surface and bulk properties. This review provides a brief introduction to the principles of XPS and ToF-SIMS and their application to the study of the surface physical and chemical properties of polymer blends.