Coherent X-ray measurement of step-flow propagation during growth on polycrystalline thin film surfaces
oleh: Randall L. Headrick, Jeffrey G. Ulbrandt, Peco Myint, Jing Wan, Yang Li, Andrei Fluerasu, Yugang Zhang, Lutz Wiegart, Karl F. Ludwig
| Format: | Article |
|---|---|
| Diterbitkan: | Nature Portfolio 2019-06-01 |
Deskripsi
Monitoring growth dynamics of crystalline thin materials progressively is crucial to understand the mechanism. Here, the authors develop a local step flow model to investigate the growth of C60 films on graphene coated over silicon substrates that correlates the step-edge velocity with its terrace lengths using the X-ray photon correlation spectroscopy.