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A novel approach to the evaluation of electromagnetic fields radiated from electronic devices by using a small shielded box is presented. Several EMC problems can be identified by employing the computations of a Radiated Model device, such as the model of the Submodule-on-Motherboard structure described here. The combination of a numerical approach, through a validation model and measurements, must be done during the design phase in multiple iterative loops to minimize the risk of non-compliance of the final qualification process. This novel combined approach requires little investment and is highly efficient for industrial applications.