Accurate Measurement of Defect Generation Rates in Silicon Carbide Irradiated with Energetic Ions
oleh: Linxin Guo, Shengyuan Peng, Yong Liu, Shang Tian, Wei Zhou, Hao Wang, Jianming Xue
| Format: | Article |
|---|---|
| Diterbitkan: | American Chemical Society 2023-10-01 |
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