Heavy Ion Characterization of a Radiation Hardened Flip-Flop Optimized for Subthreshold Operation. J. Low Power Electron. Appl. 2012, 2, 168-179
oleh: Joseph Neff, Eric MacDonald, Praveen Palakurthi, Ameet Chavan, Eric Bozeman
| Format: | Article |
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| Diterbitkan: | MDPI AG 2012-09-01 |
Deskripsi
We have found the following error in the title of this article which was recently published in J. LowPower Electron. Appl. [...]