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We proposed a new bias-approach method for measuring longitudinal relaxation time of 129Xe. Compared with the delayed pulse method, the measuring time of the proposed single-scan bias-approach is significantly decreased by more than 20 times, and the differences are 2% and 0.7% of two sample cell A and B respectively. By giving a small static magnetic field in the transverse domain, a π-pulse-induced 87Rb magnetometer signal bias with respect to the longitudinal magnetization of xenon was obtained. We then use a π/2 pulse to find the half-life time of longitudinal relaxation. Since the bias-approach has a low requirement of the systematic robust, it naturally becomes a more efficient method to measure the longitudinal relaxation time with respect to the noble gas in the vapor cell.