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An Improved Confounding Effect Model for Software Defect Prediction
oleh: Yuyu Yuan, Chenlong Li, Jincui Yang
Format: | Article |
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Diterbitkan: | MDPI AG 2023-03-01 |
Deskripsi
Software defect prediction technology can effectively improve software quality. Depending on the code metrics, machine learning models are built to predict potential defects. Some researchers have indicated that the size metric could cause confounding effects and bias the prediction results. However, evidence shows that the real confounder should be the development cycle and number of developers, which could bring confounding effects when using code metrics for prediction. This paper proposes an improved confounding effect model, introducing a new confounding variable into the traditional model. On multiple projects, we experimentally analyzed the effect extent of the confounding variable. Furthermore, we verified that controlling confounding variables helps improve the predictive model’s performance.