A new BIST scheme for low-power and high-resolution DAC testing
oleh: H. Li, J. Eckmueller, S. Sattler, H. Eichfeld, R. Weigel
| Format: | Article |
|---|---|
| Diterbitkan: | Copernicus Publications 2003-01-01 |
Deskripsi
A BIST scheme for testing on chip DAC is presented in this paper. We discuss the generation of on chip testing stimuli and the measurement of digital signals with a narrow-band digital filter. We validate the scheme with software simulation and point out the possibility of ADC BIST with verified DACicus-journals.