Surface Recombination and Space-Charge-Limited Photocurrent-Voltage (PC-V) Measurements in (Cd,Mn)Te Samples–Kinetics of Photocurrent (PC)
oleh: Andrzej Mycielski, Dominika M. Kochanowska, Aneta Wardak, Krzysztof Gościński, Michał Szot, Witold Dobrowolski, Gabriela Janusz, Małgorzata Górska, Łukasz Janiak, Wiesław Czarnacki, Łukasz Świderski, Joanna Iwanowska-Hanke, Marek Moszyński
| Format: | Article |
|---|---|
| Diterbitkan: | MDPI AG 2022-04-01 |
Deskripsi
Photocurrent-voltage characteristic (PC-V) is a method of determining the critical parameter in X-ray and gamma-ray detector plates, i.e., the carrier mobility-lifetime product, <i>μτ</i>. We show for the (Cd,Mn)Te samples that the measurement results depend strongly on the surface treatment and the space charge distribution. The PC-V characteristics obtained for <i>ħω</i> > <i>E<sub>g</sub></i> and <i>ħω</i> ~ <i>E<sub>g</sub></i> indicated that etching with 20% HCl caused an appearance of a significant concentration of very shallow surface traps at the (Cd,Mn)Te sample surface. These traps seriously changed the results of measurements of PC-V characteristics and PC kinetics. We also noticed a small contribution of holes to photoconductivity in the PC kinetics. The measurements of PC-V characteristics for <i>ħω</i> > <i>E<sub>g</sub></i> may test the detector plate surface quality.