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Pr0.5Sr0.5MnO3 films were grown on ferroelectric substrates of 0.67Pb(Mg1/3Nb2/3)O3-0.33PbTiO3 by pulsed-laser deposition method. The film structure and lattice change with electric field applied on the substrate are examined by X-ray diffraction. The electric field dependence of resistivity was compared with electric field dependence of lattice at room temperature, revealing a relation between resistance and strain. Current-induced electroresistance (CER) was studied by using different measuring current. With increasing electric filed a colossal decrease of CER at low temperature was achieved, indicating great strain effect. The piezoelectric strain effect on the magnetoelectric coupling at multiferroic interface was discussed.