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Impact Energy and Angular Dependence of L X-ray Emission from a Thick Polycrystalline Tungsten Element Induced by 15–25 keV Electrons
oleh: Bhupendra Singh, Suman Prajapati, Bhartendu K. Singh, R. Shanker
Format: | Article |
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Diterbitkan: | MDPI AG 2020-11-01 |
Deskripsi
The impact energy and angular dependence of L X-rays of a thick polycrystalline tungsten (W; atomic number, Z = 74) target induced by 15–25 keV electrons has been measured at different angles varying from 15° to 75° at intervals of 5° using a Si PIN photodiode detector. The variation of measured relative intensity of L<sub>l</sub>, L<sub>α</sub>, L<sub>β</sub> and L<sub>γ</sub> characteristic lines as a function of incidence angle is found to be anisotropic and the measured variation compares well with the PENELOPE simulation results. The angular variation of intensity ratio of L<sub>l</sub>/L<sub>α</sub> and L<sub>β</sub>/L<sub>α</sub> shows anisotropic distribution, whereas the angular variation of the L<sub>γ</sub>/L<sub>α</sub> ratio exhibits almost isotropic distribution within the uncertainty of measurements. These measured ratios are found to be in good agreement with Monte Carlo (MC) calculations. The measured intensity ratios of L<sub>β</sub>/L<sub>α</sub> and L<sub>γ</sub>/L<sub>α</sub> at a given incidence angle show a linear dependence with impact energy and exhibit good agreement with simulation results; however, the measured intensity ratio of L<sub>l</sub>/L<sub>α</sub> shows a non-linear variation with the impact energy and yields poor agreement with theoretical calculations.