1 kHz fixed-target serial crystallography using a multilayer monochromator and an integrating pixel detector
oleh: A. Tolstikova, M. Levantino, O. Yefanov, V. Hennicke, P. Fischer, J. Meyer, A. Mozzanica, S. Redford, E. Crosas, N. L. Opara, M. Barthelmess, J. Lieske, D. Oberthuer, E. Wator, I. Mohacsi, M. Wulff, B. Schmitt, H. N. Chapman, A. Meents
| Format: | Article |
|---|---|
| Diterbitkan: | International Union of Crystallography 2019-09-01 |
Deskripsi
Reliable sample delivery and efficient use of limited beam time have remained bottlenecks for serial crystallography (SX). Using a high-intensity polychromatic X-ray beam in combination with a newly developed charge-integrating JUNGFRAU detector, we have applied the method of fixed-target SX to collect data at a rate of 1 kHz at a synchrotron-radiation facility. According to our data analysis for the given experimental conditions, only about 3 000 diffraction patterns are required for a high-quality diffraction dataset. With indexing rates of up to 25%, recording of such a dataset takes less than 30 s.