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Microstructural Evolution and Growth Morphology During Formation Process of Full Cu<sub>3</sub>Sn Solder Joint in Microelectronic Packaging
oleh: LIANG Xiao-bo, LI Xiao-yan, YAO Peng, LI Yang, JIN Feng-yang
Format: | Article |
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Diterbitkan: | Journal of Materials Engineering 2018-08-01 |
Deskripsi
The full Cu<sub>3</sub>Sn solder joint has been widely used in 3D packaging gradually. 270℃ and 1N were chosen as soldering temperature and pressure respectively to fabricate solder joints under different soldering time in order to analyze the process of microstructural evolution.Cu<sub>6</sub>Sn<sub>5</sub> morphology with different soldering temperatures and time was also observed respectively to investigate the growth law of Cu<sub>6</sub>Sn<sub>5</sub> and the effect of soldering temperature on the Cu<sub>6</sub>Sn<sub>5</sub> morphology. The results show that scallop-like Cu<sub>6</sub>Sn<sub>5</sub> is formed along the Cu substrate after 30min soldering, and a thin layer of Cu<sub>3</sub>Sn is generated between Cu<sub>6</sub>Sn<sub>5</sub> and Cu substrate.When the soldering time is increased to 60min, liquid Sn is totally consumed and Cu<sub>6</sub>Sn<sub>5</sub> becomes a cohesive whole. With the increase of soldering time, Cu<sub>3</sub>Sn grows at the expense of Cu<sub>6</sub>Sn<sub>5</sub>. Cu<sub>6</sub>Sn<sub>5</sub> is totally transformed into Cu<sub>3</sub>Sn up to 480min. The growing process of Cu<sub>6</sub>Sn<sub>5</sub> includes nucleation, growth, fusion and covering up the big grain. With the increase of soldering temperature, the morphology of Cu<sub>6</sub>Sn<sub>5</sub> changes from polyhedron shape to procumbent.