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The increasing number of complex functions in implantable devices demands for an increased ability to recognize these features during patient monitoring and assessment. New device algorithm and lead structures are embryonic concerning device implantation; hence, we should familiarize ourselves and become alert of different types of device malfunction. Although it is unreasonable to expect to know the exact details of all algorithms, the numerous most often encountered should be discussed. This case highlights a novel device malfunction and its management in a 76-year-old male after coronary artery bypass grafts.