Hasil Pencarian - Yi-Pei Tsai
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Test Pattern Design for Plasma Induced Damage on Inter-Metal Dielectric in FinFET Cu BEOL Processes oleh Chi Su, Yi-Pei Tsai, Chrong-Jung Lin, Ya-Chin King
Diterbitkan 2020-05-01
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Plasma Charging Effect on the Reliability of Copper BEOL Structures in Advanced FinFET Technologies oleh Yi-Pei Tsai, Peng-Chun Liou, Chrong Jung Lin, Ya-Chin King
Diterbitkan 2018-01-01
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