Hasil Pencarian - Yi-Lung Cheng

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  1. 1
    Comparison of H2 and NH3 Treatments for Copper Interconnects

    Comparison of H2 and NH3 Treatments for Copper Interconnects oleh Yu-Min Chang, Jihperng Leu, Bing-Hong Lin, Ying-Lung Wang, Yi-Lung Cheng

    Diterbitkan 2013-01-01
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  2. 2
    Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials

    Reliability Characteristics of Metal-Insulator-Semiconductor Capacitors with Low-Dielectric-Constant Materials oleh Yi-Lung Cheng, Wei-Fan Peng, Chi-Jia Huang, Giin-Shan Chen, Jau-Shiung Fang

    Diterbitkan 2023-01-01
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  3. 3
    Electrical Characteristics and Reliability of Nitrogen-Stuffed Porous Low-<i>k</i> SiOCH/Mn<sub>2</sub>O<sub>3−x</sub>N/Cu Integration

    Electrical Characteristics and Reliability of Nitrogen-Stuffed Porous Low-<i>k</i> SiOCH/Mn<sub>2</sub>O<sub>3−x</sub>N/Cu Integration oleh Yi-Lung Cheng, Yu-Lu Lin, Chih-Yen Lee, Giin-Shan Chen, Jau-Shiung Fang

    Diterbitkan 2019-10-01
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  4. 4
    Comparison of CoW/SiO<sub>2</sub> and CoB/SiO<sub>2</sub> Interconnects from the Perspective of Electrical and Reliability Characteristics

    Comparison of CoW/SiO<sub>2</sub> and CoB/SiO<sub>2</sub> Interconnects from the Perspective of Electrical and Reliability Characteristics oleh Yi-Lung Cheng, Kai-Hsieh Wang, Chih-Yen Lee, Giin-Shan Chen, Jau-Shiung Fang

    Diterbitkan 2023-02-01
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