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    Extraction of sub-gap density of states via capacitance–voltage measurement for the erasing process in a TFT charge-trapping memory

    Extraction of sub-gap density of states via capacitance–voltage measurement for the erasing process in a TFT charge-trapping memory oleh Yen-Chang Chiang, Yang-Hsuan Hsiao, Jeng-Ting Li, Jen-Sue Chen

    Diterbitkan 2018-02-01
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