Surface Roughness-Induced Changes in Important Physical Features of CoFeSm Thin Films on Glass Substrates during Annealing oleh Chi-Lon Fern, Wen-Jen Liu, Yung-Huang Chang, Chia-Chin Chiang, Yuan-Tsung Chen, Pei-Xin Lu, Xuan-Ming Su, Shih-Hung Lin, Ko-Wei Lin