Hasil Pencarian - Ullrich Pietsch

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  1. 1
    Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging

    Determination of the stacking fault density in highly defective single GaAs nanowires by means of coherent diffraction imaging oleh Arman Davtyan, Andreas Biermanns, Otmar Loffeld, Ullrich Pietsch

    Diterbitkan 2016-01-01
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  2. 2
    Cyclic Deformation Induced Residual Stress Evolution and 3D Short Fatigue Crack Growth Investigated by Advanced Synchrotron Tomography Techniques

    Cyclic Deformation Induced Residual Stress Evolution and 3D Short Fatigue Crack Growth Investigated by Advanced Synchrotron Tomography Techniques oleh Benjamin Dönges, Melanie Syha, Anne K. Hüsecken, Ullrich Pietsch, Wolfgang Ludwig, Ulrich Krupp, Hans-Jürgen Christ

    Diterbitkan 2021-03-01
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  3. 3
    Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements

    Phase Transitions and Formation of a Monolayer-Type Structure in Thin Oligothiophene Films: Exploration with a Combined In Situ X-ray Diffraction and Electrical Measurements oleh Eduard Mikayelyan, Linda Grodd, Viachaslau Ksianzou, Daniel Wesner, Alexander I. Rodygin, Holger Schönherr, Yuriy N. Luponosov, Sergei A. Ponomarenko, Dimitri A. Ivanov, Ullrich Pietsch, Souren Grigorian

    Diterbitkan 2019-05-01
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  4. 4
    Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films

    Electrically driven transient and permanent phase transformations in highly strained epitaxial BiFeO3 thin films oleh Hyeon Jun Lee, Jeongyong Kim, Seung Hyun Hwang, Hyeokmin Choe, Semen Gorfman, Yeong-Jae Heo, Su Yong Lee, Pierre-Eymeric Janolin, Igor Kornev, Tobias U. Schülli, Carsten Richter, Joo-Hyoung Lee, Ullrich Pietsch, Chan-Ho Yang, Ji Young Jo

    Diterbitkan 2020-10-01
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