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    Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer

    Data Retention Characterization of Gate-Injected Gold-Nanoparticle Non-Volatile Memory with Low-Damage CF4-Plasma-Treated Blocking Oxide Layer oleh Yu-Hua Liu, Chyuan-Haur Kao, Tsung-Chin Cheng, Chih-I Wu, Jer-Chyi Wang

    Diterbitkan 2017-11-01
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