Hasil Pencarian - Thomas Chiarella

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  1. 1
    Analog Performance and its Variability in Sub-10 nm Fin-Width FinFETs: a Detailed Analysis

    Analog Performance and its Variability in Sub-10 nm Fin-Width FinFETs: a Detailed Analysis oleh Mandar S. Bhoir, Thomas Chiarella, Lars Ake Ragnarsson, Jerome Mitard, Valentina Terzeiva, Naoto Horiguchi, Nihar R. Mohapatra

    Diterbitkan 2019-01-01
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  2. 2
    Comparison of Temperature Dependent Carrier Transport in FinFET and Gate-All-Around Nanowire FET

    Comparison of Temperature Dependent Carrier Transport in FinFET and Gate-All-Around Nanowire FET oleh Soohyun Kim, Jungchun Kim, Doyoung Jang, Romain Ritzenthaler, Bertrand Parvais, Jerome Mitard, Hans Mertens, Thomas Chiarella, Naoto Horiguchi, Jae Woo Lee

    Diterbitkan 2020-04-01
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  3. 3
    A Pragmatic Model to Predict Future Device Aging

    A Pragmatic Model to Predict Future Device Aging oleh James Brown, Kean Hong Tok, Rui Gao, Zhigang Ji, Weidong Zhang, John S. Marsland, Thomas Chiarella, Jacopo Franco, Ben Kaczer, Dimitri Linten, Jian Fu Zhang

    Diterbitkan 2023-01-01
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  4. 4
    Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs

    Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs oleh Stanislav Tyaginov, Barry O’Sullivan, Adrian Chasin, Yaksh Rawal, Thomas Chiarella, Camila Toledo de Carvalho Cavalcante, Yosuke Kimura, Michiel Vandemaele, Romain Ritzenthaler, Jerome Mitard, Senthil Vadakupudhu Palayam, Jason Reifsnider, Ben Kaczer

    Diterbitkan 2023-07-01
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