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    Probing the edge-related properties of atomically thin MoS2 at nanoscale

    Probing the edge-related properties of atomically thin MoS2 at nanoscale oleh Teng-Xiang Huang, Xin Cong, Si-Si Wu, Kai-Qiang Lin, Xu Yao, Yu-Han He, Jiang-Bin Wu, Yi-Fan Bao, Sheng-Chao Huang, Xiang Wang, Ping-Heng Tan, Bin Ren

    Diterbitkan 2019-12-01
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