Hasil Pencarian - Taleana Huff

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  1. 1
    Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy

    Atomic defect classification of the H–Si(100) surface through multi-mode scanning probe microscopy oleh Jeremiah Croshaw, Thomas Dienel, Taleana Huff, Robert Wolkow

    Diterbitkan 2020-09-01
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  2. 2
    Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface

    Indications of chemical bond contrast in AFM images of a hydrogen-terminated silicon surface oleh Hatem Labidi, Mohammad Koleini, Taleana Huff, Mark Salomons, Martin Cloutier, Jason Pitters, Robert A. Wolkow

    Diterbitkan 2017-02-01
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  3. 3
    Lithography for robust and editable atomic-scale silicon devices and memories

    Lithography for robust and editable atomic-scale silicon devices and memories oleh Roshan Achal, Mohammad Rashidi, Jeremiah Croshaw, David Churchill, Marco Taucer, Taleana Huff, Martin Cloutier, Jason Pitters, Robert A. Wolkow

    Diterbitkan 2018-07-01
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