Hasil Pencarian - Subiao Bian

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  1. 1
    Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry

    Characterization of amorphous carbon films from 5 nm to 200 nm on single-side polished a-plane sapphire substrates by spectroscopic ellipsometry oleh Ziqing Li, Ziqing Li, Ziqing Li, Changcai Cui, Changcai Cui, Xiaolong Zhou, Subiao Bian, Subiao Bian, Subiao Bian, Oriol Arteaga, Oriol Arteaga, Xipeng Xu, Xipeng Xu

    Diterbitkan 2022-10-01
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  2. 2
    Clear imaging method for underwater targets based on the second Lorentz depolarization index

    Clear imaging method for underwater targets based on the second Lorentz depolarization index oleh Shuang Chen, Xipeng Xu, Subiao Bian, Huihui Li, Changcai Cui

    Diterbitkan 2024-10-01
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  3. 3
    FDTD-Based Study on Equivalent Medium Approximation Model of Surface Roughness for Thin Films Characterization Using Spectroscopic Ellipsometry

    FDTD-Based Study on Equivalent Medium Approximation Model of Surface Roughness for Thin Films Characterization Using Spectroscopic Ellipsometry oleh Wanpei Yu, Changcai Cui, Huihui Li, Subiao Bian, Xi Chen

    Diterbitkan 2022-08-01
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  4. 4
    Mueller Matrix Ellipsometric Characterization of Nanoscale Subsurface Damage of 4H-SiC Wafers: From Grinding to CMP

    Mueller Matrix Ellipsometric Characterization of Nanoscale Subsurface Damage of 4H-SiC Wafers: From Grinding to CMP oleh Huihui Li, Huihui Li, Changcai Cui, Changcai Cui, Jing Lu, Jing Lu, Zhongwei Hu, Zhongwei Hu, Wuqing Lin, Wuqing Lin, Wuqing Lin, Subiao Bian, Subiao Bian, Xipeng Xu, Xipeng Xu

    Diterbitkan 2022-02-01
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