Hasil Pencarian - Sheu Gene

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  1. 1
    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability

    Analysis of Anti-JFET for 600V VDMOS and HCI Reliability oleh Yang Shao-Ming, Sheu Gene, Lai Chiu-Chung, Deivasigamani Ravi

    Diterbitkan 2018-01-01
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  2. 2
    120V Low Side LDMOS Device with Sided Isolation of 0.35μm CMOS Compatible Process

    120V Low Side LDMOS Device with Sided Isolation of 0.35μm CMOS Compatible Process oleh Deivasigamani Ravi, Sheu Gene, Aryadeep Chirag, Sai S. Krishna, Selvendran S., Yang Shao-Ming

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  3. 3
    Gate Engineering in SOI LDMOS for Device Reliability

    Gate Engineering in SOI LDMOS for Device Reliability oleh Aanand, Sheu Gene, Imam Syed Sarwar, Lu Shao Wei, Aryadeep Chirag, Yang Shao Ming

    Diterbitkan 2016-01-01
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  4. 4
    Sensitivity Study of Polysilicon Nanowire Based on Scattering and Quantum Mechanics Models

    Sensitivity Study of Polysilicon Nanowire Based on Scattering and Quantum Mechanics Models oleh Aanand, Sheu Gene, Imam Syed Sarwar, Lu Shao Wei, Yang Shao-Ming, Fan Ming Jen

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  5. 5
    Design of a Low on Resistance High Voltage (120V) Novel 3D NLDMOS with Side Isolation Based on 0.35um BCD Process Technology

    Design of a Low on Resistance High Voltage (120V) Novel 3D NLDMOS with Side Isolation Based on 0.35um BCD Process Technology oleh Yang Shao-Ming, Sheu Gene, Lee Tzu Chieh, Chien Ting Yao, Wu Chieh Chih, Lin Yun Jung

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  6. 6
    Study of HCI Reliability for PLDMOS

    Study of HCI Reliability for PLDMOS oleh Deivasigamani Ravi, Sheu Gene, Aanand, Wei Lu Shao, Sarwar Imam Syed, Lai Chiu-Chung, Yang Shao-Ming

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  7. 7
    Study of impact of LATID on HCI reliability for LDMOS devices

    Study of impact of LATID on HCI reliability for LDMOS devices oleh Chandrashekhar, Sheu Gene, Yang Shao Mingo, Chien Ting Yao, Lin Yun Jung, Wu Chieh Chih, Lee Tzu Chieh

    Diterbitkan 2016-01-01
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  8. 8
    An Innovated 80V-100V High-Side Side-Isolated N-LDMOS Device

    An Innovated 80V-100V High-Side Side-Isolated N-LDMOS Device oleh Yangi Shao Ming, Sheu Gene, Chien Ting Yao, Wu Chieh Chih, Lee Tzu Chieh, Wu Ching Yuan, Lai Chiu Chung

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  9. 9
    Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device

    Analysis of Kirk effect of an innovated high side Side-Isolated N-LDMOS device oleh Lai Ciou Jhong, Sheu Gene, Chien Ting Yao, Wu Chieh Chih, Lee Tzu Chieh, Deivasigamani Ravi, Wu Ching Yuan, Chandrashekhar, Yang Shao Ming

    Diterbitkan 2016-01-01
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